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Structural Based Functional Test at Field (SBAF) is a new type of testing that provides comprehensive core test coverage complementing existing IFS tests like Scan at Field (SAF) or ArrayBist. SBAF device will appear as a new device instance (intel_ifs_2) under /sys/devices/virtual/misc. The user interaction necessary to load the test image and test a particular core is the same as the existing scan test (intel_ifs_0). During the loading stage, the driver will look for a file named ff-mm-ss-<batch02x>.sbft in the /lib/firmware/intel/ifs_2 directory. The hardware interaction needed for loading the image is similar to SAF, with the only difference being the MSR addresses used. Reuse the SAF image loading code, passing the SBAF-specific MSR addresses via struct ifs_test_msrs in the driver device data. Unlike SAF, the SBAF test image chunks are further divided into smaller logical entities called bundles. Since the SBAF test is initiated per bundle, cache the maximum number of bundles in the current image, which is used for iterating through bundles during SBAF test execution. Reviewed-by: Ashok Raj <ashok.raj@intel.com> Reviewed-by: Tony Luck <tony.luck@intel.com> Reviewed-by: Ilpo Järvinen <ilpo.jarvinen@linux.intel.com> Signed-off-by: Jithu Joseph <jithu.joseph@intel.com> Co-developed-by: Kuppuswamy Sathyanarayanan <sathyanarayanan.kuppuswamy@linux.intel.com> Signed-off-by: Kuppuswamy Sathyanarayanan <sathyanarayanan.kuppuswamy@linux.intel.com> Link: https://lore.kernel.org/r/20240801051814.1935149-3-sathyanarayanan.kuppuswamy@linux.intel.com Signed-off-by: Hans de Goede <hdegoede@redhat.com> |
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