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pwm: samsung: Fix a bit test in pwm_samsung_resume()
The PWMF_REQUESTED enum is supposed to be used with test_bit() and not
used as in a bitwise AND. In this specific code the flag will never be
set so the function is effectively a no-op.
Fixes: e3fe982b2e
("pwm: samsung: Put per-channel data into driver data")
Signed-off-by: Dan Carpenter <dan.carpenter@linaro.org>
Reviewed-by: Uwe Kleine-König <u.kleine-koenig@pengutronix.de>
Reviewed-by: Sam Protsenko <semen.protsenko@linaro.org>
Signed-off-by: Thierry Reding <thierry.reding@gmail.com>
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@ -631,7 +631,7 @@ static int pwm_samsung_resume(struct device *dev)
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struct pwm_device *pwm = &chip->pwms[i];
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struct samsung_pwm_channel *chan = &our_chip->channel[i];
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if (!(pwm->flags & PWMF_REQUESTED))
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if (!test_bit(PWMF_REQUESTED, &pwm->flags))
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continue;
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if (our_chip->variant.output_mask & BIT(i))
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