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staging:iio:documentation Add abi docs for capacitance adcs.

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Signed-off-by: Jonathan Cameron <jic23@cam.ac.uk>
Signed-off-by: Greg Kroah-Hartman <gregkh@suse.de>
This commit is contained in:
Jonathan Cameron 2011-09-21 11:15:52 +01:00 committed by Greg Kroah-Hartman
parent 15739cd2d6
commit 0baf29d658
1 changed files with 19 additions and 0 deletions
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19
drivers/staging/iio/Documentation/sysfs-bus-iio
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@ -92,6 +92,24 @@ Description:
is required is a consistent labeling. Units after application
of scale and offset are microvolts.
What: /sys/bus/iio/devices/iio:deviceX/in_capacitanceY_raw
KernelVersion: 3.2
Contact: linux-iio@vger.kernel.org
Description:
Raw capacitance measurement from channel Y. Units after
application of scale and offset are nanofarads.
What: /sys/.../iio:deviceX/in_capacitanceY-in_capacitanceZ_raw
KernelVersion: 3.2
Contact: linux-iio@vger.kernel.org
Description:
Raw differential capacitance measurement equivalent to
channel Y - channel Z where these channel numbers apply to the
physically equivalent inputs when non differential readings are
separately available. In differential only parts, then all that
is required is a consistent labeling. Units after application
of scale and offset are nanofarads..
What: /sys/bus/iio/devices/iio:deviceX/in_temp_raw
What: /sys/bus/iio/devices/iio:deviceX/in_tempX_raw
What: /sys/bus/iio/devices/iio:deviceX/in_temp_x_raw
@ -251,6 +269,7 @@ What: /sys/bus/iio/devices/iio:deviceX/in_accel_scale_available
What: /sys/.../iio:deviceX/in_voltageX_scale_available
What: /sys/.../iio:deviceX/in_voltage-voltage_scale_available
What: /sys/.../iio:deviceX/out_voltageX_scale_available
What: /sys/.../iio:deviceX/in_capacitance_scale_available
KernelVersion: 2.635
Contact: linux-iio@vger.kernel.org
Description: